Compact Models for Integrated Circuit Design
Conventional Transistors and Beyond
dc.contributor.author | Saha, Samar K. | |
dc.date.accessioned | 2019-03-02 23:55 | |
dc.date.accessioned | 2020-03-17 03:00:34 | |
dc.date.accessioned | 2020-04-01T10:51:28Z | |
dc.date.available | 2020-04-01T10:51:28Z | |
dc.date.issued | 2015-08-14 | |
dc.identifier | 1004227 | |
dc.identifier | OCN: 1100541339 | en_US |
dc.identifier.uri | http://library.oapen.org/handle/20.500.12657/25859 | |
dc.description.abstract | This modern treatise on compact models for circuit computer-aided design (CAD) presents industry standard models for bipolar-junction transistors (BJTs), metal-oxide-semiconductor (MOS) field-effect-transistors (FETs), FinFETs, and tunnel field-effect transistors (TFETs), along with statistical MOS models. Featuring exercise problems at the end of each chapter and extensive references at the end of the book, the text supplies fundamental and practical knowledge necessary for efficient integrated circuit (IC) design using nanoscale devices. It ensures even those unfamiliar with semiconductor physics gain a solid grasp of compact modeling concepts. | |
dc.language | English | |
dc.subject.classification | thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TJ Electronics and communications engineering::TJF Electronics engineering::TJFC Electronics: circuits and components | en_US |
dc.subject.other | Engineering | |
dc.subject.other | Electrical Engineering | |
dc.subject.other | computer-aided design | |
dc.subject.other | CAD | |
dc.subject.other | compact modeling | |
dc.subject.other | MOSFET | |
dc.subject.other | Circuit Simulation | |
dc.subject.other | compact models | |
dc.subject.other | SPICE model | |
dc.title | Compact Models for Integrated Circuit Design | |
dc.title.alternative | Conventional Transistors and Beyond | |
dc.type | book | |
oapen.identifier.doi | 10.1201/b19117 | |
oapen.relation.isPublishedBy | 7b3c7b10-5b1e-40b3-860e-c6dd5197f0bb | |
oapen.relation.isFundedBy | b818ba9d-2dd9-4fd7-a364-7f305aef7ee9 | |
oapen.relation.isbn | 9781482240665 | |
oapen.collection | Knowledge Unlatched (KU) | |
oapen.grant.number | 102706 | |
oapen.grant.program | KU Select 2018: STEM Backlist Books | |
oapen.identifier.isbn | 9781482240665 | |
grantor.number | 102706 | |
oapen.identifier.ocn | 1100541339 | |
peerreview.anonymity | Single-anonymised | |
peerreview.id | bc80075c-96cc-4740-a9f3-a234bc2598f1 | |
peerreview.open.review | No | |
peerreview.publish.responsibility | Publisher | |
peerreview.review.stage | Pre-publication | |
peerreview.review.type | Proposal | |
peerreview.reviewer.type | Internal editor | |
peerreview.reviewer.type | External peer reviewer | |
peerreview.title | Proposal review | |
oapen.review.comments | Taylor & Francis open access titles are reviewed as a minimum at proposal stage by at least two external peer reviewers and an internal editor (additional reviews may be sought and additional content reviewed as required). |