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dc.contributor.authorGyuráki, Roland
dc.date.accessioned2022-03-21T14:33:25Z
dc.date.available2022-03-21T14:33:25Z
dc.date.issued2022
dc.identifierONIX_20220321_9783731510642_10
dc.identifier.issn1869-1765
dc.identifier.urihttps://library.oapen.org/handle/20.500.12657/53519
dc.description.abstractThis work presents the development and application of high-speed fluorescent thermal imaging for quench analysis in high-temperature superconductors (HTS). Using a fluorescent coating, with a temperature-dependent light emission, temperature changes can be calculated over 2D surfaces. The technique uncovered peculiar transient effects in novel HTS tape architectures and also helped to verify and better understand hot spot development in both insulated and non-insulated, HTS–wound pancake coils.
dc.languageEnglish
dc.relation.ispartofseriesKarlsruher Schriftenreihe zur Supraleitung
dc.subject.classificationthema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TH Energy technology and engineering::THR Electrical engineeringen_US
dc.subject.otherSupraleiter
dc.subject.otherHochtemperatursupraleiter
dc.subject.otherWärmeaufnahme
dc.subject.otherQuench
dc.subject.othersuperconductivity
dc.subject.otherhigh-temperature superconductors
dc.subject.otherthermal imaging
dc.subject.otherquench
dc.subject.othernormal zone propagation
dc.titleFluorescent thermal imaging method for investigating transient effects in high-temperature superconductor tapes and coils
dc.typebook
oapen.identifier.doi10.5445/KSP/1000125489
oapen.relation.isPublishedBy44e29711-8d53-496b-85cc-3d10c9469be9
oapen.relation.isbn9783731510642
oapen.imprintKIT Scientific Publishing
oapen.series.number32
oapen.pages196
oapen.place.publicationKarlsruhe
peerreview.anonymityAll identities known
peerreview.id51a542ec-eaeb-47c2-861d-6022e981a97a
peerreview.open.reviewNo
peerreview.publish.responsibilityBooks or series editor
peerreview.review.stagePre-publication
peerreview.review.typeFull text
peerreview.reviewer.typeEditorial board member
peerreview.reviewer.typeExternal peer reviewer
peerreview.titleDissertations in Series (Dissertationen in Schriftenreihe)


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