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dc.contributor.authorArbet, Daniel
dc.contributor.authorSovcik, Michal
dc.contributor.authorNagy, Lukas
dc.contributor.authorStopjakova, Viera
dc.date.accessioned2024-05-23T10:13:28Z
dc.date.available2024-05-23T10:13:28Z
dc.date.issued2021
dc.identifierONIX_20240523__58
dc.identifier.urihttps://library.oapen.org/handle/20.500.12657/90538
dc.description.abstractundefined
dc.languageEnglish
dc.subject.classificationthema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TG Mechanical engineering and materials::TGP Production and industrial engineering::TGPR Reliability engineering
dc.subject.otherReliability engineering
dc.titleChapter Digital On-Chip Calibration of Analog Systems towards Enhanced Reliability
dc.typechapter
oapen.identifier.doi10.5772/intechopen.96609
oapen.relation.isPublishedBy09f6769d-48ed-467d-b150-4cf2680656a1*
oapen.relation.isFundedBy178e65b9-dd53-4922-b85c-0aaa74fce079
oapen.collectionEuropean Research Council (ERC)
oapen.grant.number876868
oapen.grant.acronymPROGRESSUS


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