Semiconductor Packaging
Materials Interaction and Reliability
dc.contributor.author | Chen, Andrea | |
dc.contributor.author | Lo, Randy Hsiao-Yu | |
dc.date.accessioned | 2020-09-21T13:34:11Z | |
dc.date.available | 2020-09-21T13:34:11Z | |
dc.date.issued | 2012 | |
dc.identifier | ONIX_20200921_9781439862070_22 | |
dc.identifier.uri | https://library.oapen.org/handle/20.500.12657/41662 | |
dc.description.abstract | In semiconductor manufacturing, understanding how various materials behave and interact is critical to making a reliable and robust semiconductor package. Semiconductor Packaging: Materials Interaction and Reliability provides a fundamental understanding of the underlying physical properties of the materials used in a semiconductor package. By tying together the disparate elements essential to a semiconductor package, the authors show how all the parts fit and work together to provide durable protection for the integrated circuit chip within as well as a means for the chip to communicate with the outside world. The text also covers packaging materials for MEMS, solar technology, and LEDs and explores future trends in semiconductor packages. | |
dc.language | English | |
dc.subject.classification | thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TJ Electronics and communications engineering::TJF Electronics engineering | en_US |
dc.subject.classification | thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TJ Electronics and communications engineering::TJF Electronics engineering::TJFC Electronics: circuits and components | en_US |
dc.subject.classification | thema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TG Mechanical engineering and materials::TGM Materials science | en_US |
dc.subject.other | Circuits and Devices | |
dc.subject.other | Electromagnetics and Microwaves | |
dc.subject.other | Electronic Packaging | |
dc.subject.other | ENG | |
dc.subject.other | MATERIALS | |
dc.subject.other | ElectricalEngineering | |
dc.subject.other | SCI-TECH | |
dc.subject.other | STM | |
dc.subject.other | array | |
dc.subject.other | ball | |
dc.subject.other | compound | |
dc.subject.other | frame | |
dc.subject.other | grid | |
dc.subject.other | lead | |
dc.subject.other | level | |
dc.subject.other | molding | |
dc.subject.other | package | |
dc.subject.other | wafer | |
dc.title | Semiconductor Packaging | |
dc.title.alternative | Materials Interaction and Reliability | |
dc.type | book | |
oapen.identifier.doi | 10.1201/b11260 | |
oapen.relation.isPublishedBy | 7b3c7b10-5b1e-40b3-860e-c6dd5197f0bb | |
oapen.imprint | CRC Press | |
oapen.pages | 216 | |
peerreview.anonymity | Single-anonymised | |
peerreview.id | bc80075c-96cc-4740-a9f3-a234bc2598f1 | |
peerreview.open.review | No | |
peerreview.publish.responsibility | Publisher | |
peerreview.review.stage | Pre-publication | |
peerreview.review.type | Proposal | |
peerreview.reviewer.type | Internal editor | |
peerreview.reviewer.type | External peer reviewer | |
peerreview.title | Proposal review | |
oapen.review.comments | Taylor & Francis open access titles are reviewed as a minimum at proposal stage by at least two external peer reviewers and an internal editor (additional reviews may be sought and additional content reviewed as required). | |
oapen.review.comments | Taylor & Francis open access titles are reviewed as a minimum at proposal stage by at least two external peer reviewers and an internal editor (additional reviews may be sought and additional content reviewed as required). |