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dc.contributor.authorChen, Andrea
dc.contributor.authorLo, Randy Hsiao-Yu
dc.date.accessioned2020-09-21T13:34:11Z
dc.date.available2020-09-21T13:34:11Z
dc.date.issued2012
dc.identifierONIX_20200921_9781439862070_22
dc.identifier.urihttps://library.oapen.org/handle/20.500.12657/41662
dc.description.abstractIn semiconductor manufacturing, understanding how various materials behave and interact is critical to making a reliable and robust semiconductor package. Semiconductor Packaging: Materials Interaction and Reliability provides a fundamental understanding of the underlying physical properties of the materials used in a semiconductor package. By tying together the disparate elements essential to a semiconductor package, the authors show how all the parts fit and work together to provide durable protection for the integrated circuit chip within as well as a means for the chip to communicate with the outside world. The text also covers packaging materials for MEMS, solar technology, and LEDs and explores future trends in semiconductor packages.
dc.languageEnglish
dc.subject.classificationthema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TJ Electronics and communications engineering::TJF Electronics engineeringen_US
dc.subject.classificationthema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TJ Electronics and communications engineering::TJF Electronics engineering::TJFC Electronics: circuits and componentsen_US
dc.subject.classificationthema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TG Mechanical engineering and materials::TGM Materials scienceen_US
dc.subject.otherCircuits and Devices
dc.subject.otherElectromagnetics and Microwaves
dc.subject.otherElectronic Packaging
dc.subject.otherENG
dc.subject.otherMATERIALS
dc.subject.otherElectricalEngineering
dc.subject.otherSCI-TECH
dc.subject.otherSTM
dc.subject.otherarray
dc.subject.otherball
dc.subject.othercompound
dc.subject.otherframe
dc.subject.othergrid
dc.subject.otherlead
dc.subject.otherlevel
dc.subject.othermolding
dc.subject.otherpackage
dc.subject.otherwafer
dc.titleSemiconductor Packaging
dc.title.alternativeMaterials Interaction and Reliability
dc.typebook
oapen.identifier.doi10.1201/b11260
oapen.relation.isPublishedBy7b3c7b10-5b1e-40b3-860e-c6dd5197f0bb
oapen.imprintCRC Press
oapen.pages216
peerreview.anonymitySingle-anonymised
peerreview.idbc80075c-96cc-4740-a9f3-a234bc2598f1
peerreview.open.reviewNo
peerreview.publish.responsibilityPublisher
peerreview.review.stagePre-publication
peerreview.review.typeProposal
peerreview.reviewer.typeInternal editor
peerreview.reviewer.typeExternal peer reviewer
peerreview.titleProposal review
oapen.review.commentsTaylor & Francis open access titles are reviewed as a minimum at proposal stage by at least two external peer reviewers and an internal editor (additional reviews may be sought and additional content reviewed as required).
oapen.review.commentsTaylor & Francis open access titles are reviewed as a minimum at proposal stage by at least two external peer reviewers and an internal editor (additional reviews may be sought and additional content reviewed as required).


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