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dc.contributor.editorBondavalli, Andrea
dc.contributor.editorBrancati, Francesco
dc.date.accessioned2022-11-28T16:03:37Z
dc.date.available2022-11-28T16:03:37Z
dc.date.issued2017
dc.identifierONIX_20221128_9781000795462_17
dc.identifier.urihttps://library.oapen.org/handle/20.500.12657/59733
dc.description.abstractIn recent years, a considerable amount of effort has been devoted, both in industry and academia, to the development, validation and verification of critical systems, i.e. those systems whose malfunctions or failures reach a critical level both in terms of risks to human life as well as having a large economic impact.Certifications of Critical Systems – The CECRIS Experience documents the main insights on Cost Effective Verification and Validation processes that were gained during work in the European Research Project CECRIS (acronym for Certification of Critical Systems). The objective of the research was to tackle the challenges of certification by focusing on those aspects that turn out to be more difficult/important for current and future critical systems industry: the effective use of methodologies, processes and tools.The CECRIS project took a step forward in the growing field of development, verification and validation and certification of critical systems. It focused on the more difficult/important aspects of critical system development, verification and validation and certification process. Starting from both the scientific and industrial state of the art methodologies for system development and the impact of their usage on the verification and validation and certification of critical systems, the project aimed at developing strategies and techniques supported by automatic or semi-automatic tools and methods for these activities, setting guidelines to support engineers during the planning of the verification and validation phases.
dc.languageEnglish
dc.subject.classificationthema EDItEUR::T Technology, Engineering, Agriculture, Industrial processes::TJ Electronics and communications engineering::TJF Electronics engineering::TJFM Automatic control engineeringen_US
dc.subject.classificationthema EDItEUR::U Computing and Information Technology::UT Computer networking and communications::UTR Distributed systemsen_US
dc.subject.otherAutomatic control engineering
dc.subject.otherDistributed systems
dc.titleCertifications of Critical Systems – The CECRIS Experience
dc.typebook
oapen.identifier.doi10.1201/9781003337485
oapen.relation.isPublishedBy7b3c7b10-5b1e-40b3-860e-c6dd5197f0bb
oapen.relation.isFundedBy3983007a-5726-4f1e-b9df-3fbc771f2916
oapen.relation.isbn9781000795462
oapen.relation.isbn9781003337485
oapen.relation.isbn9788793519565
oapen.imprintRiver Publishers
oapen.pages312
oapen.grant.number[...]
peerreview.anonymitySingle-anonymised
peerreview.idbc80075c-96cc-4740-a9f3-a234bc2598f1
peerreview.open.reviewNo
peerreview.publish.responsibilityPublisher
peerreview.review.stagePre-publication
peerreview.review.typeProposal
peerreview.reviewer.typeInternal editor
peerreview.reviewer.typeExternal peer reviewer
peerreview.titleProposal review
oapen.review.commentsTaylor & Francis open access titles are reviewed as a minimum at proposal stage by at least two external peer reviewers and an internal editor (additional reviews may be sought and additional content reviewed as required).


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